太赫兹无损检测:修订间差异

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|T = zh-cn:太赫兹无损检测; zh-hk:太赫兹非破壞檢測; zh-tw:太赫兹非破壞檢測;
|T = zh-cn:太赫兹无损检测; zh-hk:太赫兹非破壞檢測; zh-tw:太赫兹非破壞檢測;
|1 = zh-cn:无损检测; zh-hk:非破壞檢測; zh-tw:非破壞檢測;
|1 = zh-cn:无损检测; zh-hk:非破壞檢測; zh-tw:非破壞檢測;
|2 = zh-cn:质量控制; zh-hk:品質控制; zh-tw:品質控制;
}}
}}
'''太赫兹无损检测'''(Terahertz nondestructive evaluation),是一種應用[[太赫茲|太赫波域]][[电磁辐射]]设备進行檢測、分析及评估的技術。这些装置和技术可用來评估材料、元件或系统的性质,而不会對它們造成损伤。<ref name=RF-Anastasi>
'''太赫兹无损检测'''(Terahertz nondestructive evaluation),是一種應用[[太赫茲|太赫波域]][[电磁辐射]]设备進行檢測、分析及评估的技術。这些装置和技术可用來评估材料、元件或系统的性质,而不会對它們造成损伤。<ref name=RF-Anastasi>
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| isbn =978-981-270-409-2}}</ref>
| isbn =978-981-270-409-2}}</ref>


太赫兹成像是用于电介质(不导通,即绝缘体),材料分析质量控制在制药生物医学安全材料特性,以及航空航天等行业的新兴和显著无损评价 [[无损检测]] 技术<ref>
太赫兹成像是一種新兴受到重視的[[无损检测]]技术。在制药、[[生物医学]]、安全材料科學[[航空航天]]等行业裡,用于[[电介质]](不导通,即绝缘体)材料分析和质量控制<ref>
{{cite journal
{{cite journal
|last=Ospald|first=Frank
|last=Ospald|first=Frank
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|doi=10.1117/1.OE.53.3.031208
|doi=10.1117/1.OE.53.3.031208
|url=http://opticalengineering.spiedigitallibrary.org/article.aspx?articleid=1790444}}
|url=http://opticalengineering.spiedigitallibrary.org/article.aspx?articleid=1790444}}
</ref>。它已經被證實可以有效檢查顏料與被覆的分層<ref>
</ref>
{{cite journal
|last=Petkie|first=Douglas
|author2=Izaak V. Kemp |author3=Carla Benton |author4=Christopher Boyer |author5=Lindsay Owens |author6=Jason A. Deibel |author7=Christopher D. Stoik |author8= Matthew J. Bohn
|title=5 October 2009
|journal=SPIE Proceedings
|date=5 October 2009
|volume=7485
|doi=10.1117/12.830540
|url=http://144.206.159.178/ft/CONF/16437469/16437477.pdf}}
</ref> 、偵測[[陶磁器|陶磁]]與[[複合材料]]的缺陷
<ref>
<ref>
{{cite web
{{cite web
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|url=http://www.ipm.fraunhofer.de/content/dam/ipm/en/PDFs/Product%20sheet/TMS%20Terahertz%20Measurement%20and%20Systems/IPM_Artikel_THz_engl_END.pdf
|url=http://www.ipm.fraunhofer.de/content/dam/ipm/en/PDFs/Product%20sheet/TMS%20Terahertz%20Measurement%20and%20Systems/IPM_Artikel_THz_engl_END.pdf
|publisher=Fraunhofer Institute for Physical Measurement Techniques IPM}}
|publisher=Fraunhofer Institute for Physical Measurement Techniques IPM}}
</ref>,以及斷層掃瞄画作與手稿的物理结构<ref>
</ref>
和成像的画的物理结构[3] [4]非破坏性评估使用THz波的使多层结构体的检查,并能识别异物夹杂物脱粘分层机械冲击破坏热损伤异常和水或液压流体的侵入<ref>
{{cite journal
{{cite journal
|last=Walker
|last=Walker
第59行: 第66行:
|doi=10.1364/OE.21.008126
|doi=10.1364/OE.21.008126
}}
}}
</ref>
</ref><ref>
{{cite journal
<ref>
|last=Pastorelli
|first=Gianluca
|author2=Trafela, Tanja |author3=Taday, Phillip F. |author4=Portieri, Alessia |author5=Lowe, David |author6=Fukunaga, Kaori |author7= Strlič, Matija
|title=Characterisation of historic plastics using terahertz time-domain spectroscopy and pulsed imaging
|journal=Analytical and Bioanalytical Chemistry
|date=25 March 2012
|volume=403
|issue=5
|pages=1405–1414
|doi=10.1007/s00216-012-5931-9
|pmid=22447218}}
</ref><ref>
{{cite web
{{cite web
|title=Terahertz for Conservation of Paintings, Manuscripts and Artefacts
|title=Terahertz for Conservation of Paintings, Manuscripts and Artefacts
|url=http://www.teraview.com/applications/nondestructive-testing/art.html
|url=http://www.teraview.com/applications/nondestructive-testing/art.html
|publisher=[[TeraView]]}}
|publisher=[[TeraView]]}}
</ref>。使THz波於非破坏性评估,可進行多层结构体的检查,并能识别异物夹杂物脱粘分层机械冲击破坏热损伤异常和水或液压流体的侵入<ref>
</ref>
用于非破坏性评估使用THz波的使多层结构的检查,并能识别从异物夹杂物,脱粘和分层,机械冲击破坏,热损伤,以及水或液压流体的侵入异常。
<ref>
{{cite journal
{{cite journal
|last=Hsu
|last=Hsu
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|pages=533–540
|pages=533–540
|doi=10.1063/1.3591897|url=http://proceedings.aip.org/resource/2/apcpcs/1335/1/533_1?isAuthorized=no}}
|doi=10.1063/1.3591897|url=http://proceedings.aip.org/resource/2/apcpcs/1335/1/533_1?isAuthorized=no}}
</ref>
</ref>
它可以由飞行的方法,雷达技术和断层摄影时间来完成。<ref>
{{cite journal
|last=Guillet
|first=Jean-Paul
|author2=Recur, Benoit |author3=Frederique, Louis |author4=Bousquet, Bruno |author5=Canioni, Lionel |author6=Manel-Honninger, Inka |author7=Desbarats, Psacal |author8=Mounaix, Patrick
|title= Review of Terahertz tomography techniques
|journal=Journal of Infrared, Millimeter, and Terahertz Waves
|date=28 February 2014
|volume=35
|issue=4
|pages=382--411
|doi=10.1007/s10762-014-0057-0|url=https://hal.archives-ouvertes.fr/hal-00968839
}}
</ref>


{{EMSpectrum}}
{{EMSpectrum}}

2015年9月1日 (二) 15:17的版本

太赫兹无损检测(Terahertz nondestructive evaluation),是一種應用太赫波域电磁辐射设备進行檢測、分析及评估的技術。这些装置和技术可用來评估材料、元件或系统的性质,而不会對它們造成损伤。[1]

太赫兹成像是一種新兴和受到重視的无损检测技术。在制药、生物医学、安全、材料科學及航空航天等行业裡,用于电介质(不导通,即绝缘体)材料分析和质量控制[2]。它已經被證實可以有效檢查顏料與被覆的分層[3] 、偵測陶磁複合材料的缺陷 [4],以及斷層掃瞄画作與手稿的物理结构[5][6][7]。使用THz波於非破坏性评估,可進行多层结构体的检查,并能识别异物、夹杂物、脱粘分层、机械冲击破坏、热损伤异常和水或液压流体的侵入[8]

  1. ^ Anastasi, RF; et al. Terahertz NDE for aerospace applications (Chapter title:). Book title: Ultrasonic and advanced methods for nondestructive testing and material characterization. World Scientific Publishing. May 2007: 279–303. ISBN 978-981-270-409-2. 
  2. ^ Ospald, Frank; Wissem Zouaghi; Rene Beigang; Matheis Carster. Aeronautics composite material inspection with a terahertz time-domain spectroscopy system. Optical Engineering. 16 December 2013, 53. doi:10.1117/1.OE.53.3.031208. 
  3. ^ Petkie, Douglas; Izaak V. Kemp; Carla Benton; Christopher Boyer; Lindsay Owens; Jason A. Deibel; Christopher D. Stoik; Matthew J. Bohn. 5 October 2009 (PDF). SPIE Proceedings. 5 October 2009, 7485. doi:10.1117/12.830540. 
  4. ^ Jonuscheit, Joachim. Technical ceramics: tracking down defects (PDF). Fraunhofer Institute for Physical Measurement Techniques IPM. 
  5. ^ Walker, Gillian; Bowen, John W.; Matthews, Wendy; Roychowdhury, Soumali; Labaune, Julien; Mourou, Gerard; Menu, Michel; Hodder, Ian; Jackson, J. Bianca. Sub-surface terahertz imaging through uneven surfaces: visualizing Neolithic wall paintings in Çatalhöyük. Optics Express. 27 March 2013, 21 (7): 8126–8134. doi:10.1364/OE.21.008126. 
  6. ^ Pastorelli, Gianluca; Trafela, Tanja; Taday, Phillip F.; Portieri, Alessia; Lowe, David; Fukunaga, Kaori; Strlič, Matija. Characterisation of historic plastics using terahertz time-domain spectroscopy and pulsed imaging. Analytical and Bioanalytical Chemistry. 25 March 2012, 403 (5): 1405–1414. PMID 22447218. doi:10.1007/s00216-012-5931-9. 
  7. ^ Terahertz for Conservation of Paintings, Manuscripts and Artefacts. TeraView. 
  8. ^ Hsu, David; Kwang‐Hee Im; Chien‐Ping Chiou; Daniel J. Barnard. An exploration of the utilities of terahertz waves for the NDE of composites. AIP Conference Proceedings 1335. 23 July 2010, 30: 533–540. doi:10.1063/1.3591897.