俄歇電子能譜學
俄歇電子能譜學（Auger electron spectroscopy，簡稱AES），是一種表面科學和材料科學的分析技術。因此技術主要藉由俄歇效應進行分析而命名之。產生於受激發的原子的外層電子跳至低能階所放出的能量被其他外層電子吸收而使後者逃脫離開原子，這一連串事件稱為俄歇效應，而逃脫出來的電子稱為俄歇電子。1953年，俄歇電子能譜逐漸開始被實際應用於鑑定樣品表面的化學性質及組成的分析[1][2][3][4]。其特點是俄歇電子來自淺層表面，僅帶出表面的資訊，並且其能譜的能量位置固定，容易分析。
參見
[編輯]- UPS, 紫外光電子能譜學 (for gases, aka PES)
- PES, 光電子發射光譜學 (for solid surfaces, aka UPS)
- ZEKE, 零電子動能 spectroscopy
- XPS, X射線光電子能譜學
參考資料
[編輯]- ^ Thomas A., Carlson. Photoelectron and Auger Spectroscopy. New York: Plenum Press. 1975. ISBN 0-306-33901-3.
- ^ Briggs, David; Martin P. Seah. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy. Chichester: John Wiley & Sons. 1983. ISBN 0-471-26279-X.
- ^ Thompson, Michael; M. D. Baker; A. Christie; J. F. Tyson. Auger Electron Spectroscopy. Chichester: John Wiley & Sons. 1985. ISBN 0-471-04377-X.
- ^ Davis, L. E. (ed.). Modern Surface Analysis: Metallurgical Applications of Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS). Warrendale: The Metallurgical Society of AIME. 1980. ISBN 0-89520-358-8.
延伸閱讀
[編輯]- An Introduction to Surface Analysis by XPS and AES, J.F.Watts, J.Wolstenholme, published by Wiley & Sons, 2003, Chichester, UK, ISBN 978-0-470-84713-8
- Jenkins, Leslie H.; M. F. Chung. Auger electron energies of the outer shell electrons. Surface Science. September 1970, 22 (2): 479–485. Bibcode:1970SurSc..22..479C. doi:10.1016/0039-6028(70)90099-3.
- Larkins, F. P. Semiempirical Auger-electron energies for elements 10 ≤ Z ≤ 100. Atomic Data and Nuclear Data Tables. October 1977, 20 (4): 311–387. Bibcode:1977ADNDT..20..311L. doi:10.1016/0092-640X(77)90024-9.
- Burhop, E. H. S. Le rendement de fluorescence. Journal de Physique et le Radium. July 1955, 16 (7): 625–629. doi:10.1051/jphysrad:01955001607062500 （法語）.
- Worthington, C. R.; G. Tomlin. The Intensity of Emission of Characteristic X-Radiation. Proceedings of the Physical Society. Series A. May 1956, 69 (5): 401–412. Bibcode:1956PPSA...69..401W. doi:10.1088/0370-1298/69/5/305.
- Paparazzo, E. Comment on 'AES and SAM microanalysis of structure ceramics by thinning and coating the backside.' Yu and Jin. Surface and Interface Analysis. December 2001, 31 (12): 1110–1111. doi:10.1002/sia.1144.
- "Auger Electron Spectroscopy", J. Wolstenholme, published by Momentum Press, LLC, 2015, New York, ISBN 978-1-60650-681-3 (print), 978-1-60650-682-0 (e-book)